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SAE J784 Revision A

SAE J784 Revision A

Original price was: $148.00.Current price is: $89.00.

Residual Stress Measurement by X-Ray Diffraction

standard by SAE International, 08/01/1971

Category: SAE

Description

SAE J784A – Residual Stress Measurement by X-Ray Diffraction

Product Details

Published:: 08/01/1971
File Size:: 1 file , 8.9 MB
Note:: This product is unavailable in Ukraine, Russia, Belarus

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